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Volumn 36, Issue 10 A, 2003, Pages
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Bragg-case section topography of growth defects in Si: Ge crystals
a b c d d |
Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL DEFECTS;
CRYSTAL GROWTH FROM MELT;
CRYSTAL ORIENTATION;
GERMANIUM;
IMAGING TECHNIQUES;
REFLECTION;
SILICON;
SYNCHROTRON RADIATION;
BRAGG-CASE SECTION TOPOGRAPHY;
TRANSMISSION LANG TOPOGRAPHY;
X RAY CRYSTALLOGRAPHY;
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EID: 0038621878
PISSN: 00223727
EISSN: None
Source Type: Journal
DOI: 10.1088/0022-3727/36/10A/327 Document Type: Article |
Times cited : (10)
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References (7)
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