Non-destructive technique for the direct measurement of the local temperature distribution in VCSELs

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4648, Issue , 2002, Pages 22-29

  Dabbicco, Maurizio ^a   Spagnolo, Vincenzo ^a   Ferrara, Michele ^a   Scamarcio, Gaetano ^a  

^a UNIVERSITY OF BARI   (Italy)

Author keywords

Electroluminescence; Semiconductor lasers; Temperature measurement; Testing; VCSEL

Indexed keywords

CARRIER CONCENTRATION; CONTINUOUS WAVE LASERS; ELECTROLUMINESCENCE; LASER DIAGNOSTICS; LIGHT EMISSION; NONDESTRUCTIVE EXAMINATION; OPTICAL MICROSCOPY; TEMPERATURE DISTRIBUTION; TEMPERATURE MEASUREMENT; THERMAL EFFECTS;

THERMAL SCANNING MICROSCOPES; VERTICAL-CAVITY SURFACE-EMITTING LASERS (VCSEL);

SEMICONDUCTOR LASERS;

EID: 0036030654     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.462656     Document Type: Conference Paper

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