2-D temperature mapping of vertical-cavity surface-emitting lasers determined by microprobe electroluminescence

IEEE Photonics Technology Letters

Volumn 14, Issue 3, 2002, Pages 266-268

  Dabbicco, M ^a   Spagnolo, V ^a   Scamarcio, G ^a  

^a UNIVERSITY OF BARI   (Italy)

Author keywords

Electroluminescence; Semiconductor lasers; Temperature measurement; Vertical cavity surface emitting lasers (VCSEL)

Indexed keywords

ELECTROLUMINESCENCE; MAPPING; PHOTOLUMINESCENCE; TEMPERATURE MEASUREMENT;

VERTICAL CAVITY SURFACE EMITTING LASERS (VCSEL);

SEMICONDUCTOR LASERS;

EID: 0036504329     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/68.986781     Document Type: Article

References (12)

1. Thermally induced local gain suppression in vertical-cavity surface-emitting lasers
2. Characteristics of polarization switching from the low to the high frequency mode in vertical-cavity surface-emitting lasers
3. Spectrally-resolved near-field investigation of proton implanted vertical cavity surface emitting lasers
4. High temperature pulsed and continuous-wave operation and thermally stable threshold characteristics of vertical-cavity surface-emitting lasers grown by metalorganic chemical vapor deposition
5. Scanning thermal microscopy of a vertical-cavity surface-emitting laser
6. Effect of spatial filtering on the spontaneous emission of a sub-threshold VCSEL
7. Near-field optical microscopy of cleaved vertical-cavity surface-emitting lasers
8. Photocurrent spectroscopy of Bragg mirrors in vertical cavity surface emitting lasers
9. Transverse modes in gain-guided vartical-cavity surface-emitting lasers
10. Technique for lateral temperature profiling in optoelectronic devices using a photoluminescence microprobe