Efficient Monte Carlo device simulation with automatic error control

International Conference on Simulation of Semiconductor Processes and Devices, SISPAD

Volumn , Issue , 2000, Pages 27-30

  Bufler, F M ^a   Schenk, A ^a   Fichtner, W ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATION; COMPUTER SIMULATION; MONTE CARLO METHODS; MOSFET DEVICES;

DRAIN CURRENTS; SUBSTRATE CURRENTS;

GATES (TRANSISTOR);

EID: 0033711577     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (13)