A combined scanning tunneling microscopy and electron energy loss spectroscopy study on the formation of thin, well-ordered β-Ga2O3 films on CoGa(001)

Journal of Applied Physics

Volumn 83, Issue 5, 1998, Pages 2533-2538

  Schmitz, G ^a   Gassmann, P ^a,b   Franchy, R ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b Dresdner Bank AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY GAP; LOW ENERGY ELECTRON DIFFRACTION; SCANNING TUNNELING MICROSCOPY; SUBSTRATES;

BAND GAP; METAL OXIDES;

THIN FILMS;

EID: 0032024139     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367014     Document Type: Article

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