Determination of the absolute value of the semiconductor surface potential by the quasi-static capacitance-voltage characteristics of an MIS structure

Semiconductors

Volumn 37, Issue 6, 2003, Pages 661-666

  Zhdan, A G ^a   Kukharskaya, N F ^a   Chucheva, G V ^a  

^a INST OF RADIO ENG AND ELECTRONICS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038496827     PISSN: 10637826     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1582532     Document Type: Article

References (21)

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