X-ray magnetic microscopy for correlations between magnetic domains and crystal structure

Journal De Physique. IV : JP

Volumn 104, Issue , 2003, Pages 477-481

  Denbeaux, G ^a   Anderson, E ^a   Bates, B ^a   Chao, W ^a   Liddle, J A ^a   Harteneck, B ^a   Pearson, A ^a   Salmassi, F ^a   Schneider, G ^a   Fischer, P ^b   Eimuller T ^b   Taylor, S ^a   Chang, H ^a   Kusinski, G J ^c  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^c MMFX Technologies   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; IMAGING TECHNIQUES; LIGHT POLARIZATION; MAGNETIC DOMAINS; MAGNETIC FILMS; MULTILAYERS; SPUTTER DEPOSITION; X RAYS;

HIGH-RESOLUTION IMAGING; X-RAY MAGNETIC CIRCULAR DICHROISM; X-RAY MAGNETIC MICROSCOPY;

MICROSCOPIC EXAMINATION;

EID: 0038363815     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:20030126     Document Type: Conference Paper

References (13)

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