A full field transmission x-ray microscope as a tool for high-resolution magnetic imaging

IEEE Transactions on Magnetics

Volumn 37, Issue 4 I, 2001, Pages 2764-2766

  Denbeaux, Gregory ^a   Fischer, Peter ^b   Kusinski, Greg ^a   Le Gros, Mark ^a   Pearson, Angelic ^a   Attwood, David ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF WÜRZBURG   (Germany)

Author keywords

High resolution; Magnetic imaging; X ray microscopy

Indexed keywords

LIGHT POLARIZATION; LIGHTING; MAGNETIC DOMAINS; PHOTONS; RADIATION; X RAY MICROSCOPES;

MAGNETIC IMAGING; TRANSMISSION X-RAY MICROSCOPES;

IMAGING TECHNIQUES;

EID: 0035386535     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.951300     Document Type: Article

References (12)

1. The high resolution x-ray microscope, XM-1
2. New high-resolution zone-plate microscope at beamline 6.1 of the ALS
3. Element-specific imaging of magnetic domains at 25nm spatial resolution using soft X-ray microscopy
4. Spectromicroscopy at the XM-1
5. Nanofabrication and diffractive optics for high-resolution x-ray applications
6. Soft x-ray microscopy to 25 nm with applications to biology and magnetic materials
7. Automatic image acquisition, calibration and montage assembly for biological x-ray microscopy
8. Ion beam patterning of magnetic films using stencil masks
9. Lorentz transmission electron microscopy investigation of magnetically patterned Co/Pt multilayers