High resolution soft X-ray microscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4146, Issue , 2000, Pages 171-175

  Chao, Weilun ^a   Anderson, Erik H ^a   Denbeaux, Gregory ^a   Harteneck, Bruce ^a   Le Gros, Mark ^a   Pearson, Angelic L ^a   Olynick, Deirdre ^a   Attwood, David ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; IMAGING SYSTEMS; OPTICAL RESOLVING POWER; PATTERN RECOGNITION;

SOFT X-RAY OPTICS; ZONE PLATES;

X RAY MICROSCOPES;

EID: 0034505763     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.406671     Document Type: Conference Paper

References (4)