Small-angle x-ray scattering and electron microscopy investigation of silica and carbon replicas with ordered porosity

Langmuir

Volumn 19, Issue 10, 2003, Pages 4303-4308

  Ehrburger Dolle, Françoise ^a   Morfin, Isabelle ^a   Geissler, Erik ^a   Bley, Françoise ^b   Livet, Frédéric ^b   Vix Guterl, Cathie ^c   Saadallah, Seifedine ^c   Parmentier, Julien ^d   Reda, Mohamad ^d   Patarin, Joël ^d   Iliescu, Monica ^e   Werckmann, Jacques ^e  

^a LIPHY   (France)

^b UNIV GRENOBLE ALPES   (France)

^c INSTITUT DE CHIMIE DES SURFACES ET INTERFACES   (France)

^d Ecole Nationale Superieure de Chimie de Mulhouse   (France)

^e INSTITUT DE PHYSIQUE ET CHIMIE DES MATÉRIAUX DE STRASBOURG   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; CARRIER CONCENTRATION; DISSOLUTION; ELECTRON MICROSCOPY; HYDROFLUORIC ACID; IMPREGNATION; INFILTRATION; POROSITY; SHRINKAGE; SOLUTIONS; SUGAR (SUCROSE); X RAY SCATTERING;

CHEMICAL VAPOR INFILTRATION; LIQUID IMPREGNATION; MICROPORES; ORDERED NANOPOROUS CARBONS; REPLICA TECHNIQUE; SILICA MESOPORE FILLING; SILICA TEMPLATE; SMALL ANGLE X RAY SCATTERING;

SILICA;

EID: 0038359756     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la0269457     Document Type: Article

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