SAXS analysis of interface in organo-modified mesoporous silica

Surface and Interface Analysis

Volumn 31, Issue 9, 2001, Pages 897-900

  Li, Zhi Hong ^a   Gong, Yan Jun ^a   Wu, Dong ^a   Sun, Yu Han ^a   Wang, Jun ^b   Liu, Yi ^b   Dong, Bao Zhong ^b  

^a INSTITUTE OF COAL CHEMISTRY   (China)

^b INSTITUTE OF HIGH ENERGY PHYSICS   (China)

Author keywords

Interface; Negative deviation; Organo modified mesoporous silica; Porod's law; SAXS

Indexed keywords

CHEMICAL MODIFICATION; CRYSTAL MICROSTRUCTURE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INTERFACES (MATERIALS); INTERFACIAL ENERGY; MESOPOROUS MATERIALS; NUCLEAR MAGNETIC RESONANCE; POROSITY; SYNCHROTRON RADIATION; SYNTHESIS (CHEMICAL); X RAY SCATTERING;

SMALL-ANGLE X-RAY SCATTERING (SAXS);

SILICA;

EID: 0035445839     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1118     Document Type: Article

References (10)