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Volumn 42, Issue 4 B, 2003, Pages 1887-1891

A new microwave-excited plasma etching equipment for separating plasma excited region from etching process region

Author keywords

Excess decomposition; Microwave excited plasma; Reactive ion etching; RLSA; Shower head; SiO2 etching

Indexed keywords

DECOMPOSITION; ELECTRONS; EQUIPMENT; FLUORINE COMPOUNDS; IONS; MICROWAVES; PLASMA DENSITY; PLASMA SOURCES; SILICA; SLOT ANTENNAS; TEMPERATURE;

EID: 0038348100     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.1887     Document Type: Article
Times cited : (38)

References (8)
  • 8
    • 0037479961 scopus 로고    scopus 로고
    • Doctral Thesis, Tohoku University; Chap. 4
    • M. Hirayama: Doctral Thesis, Tohoku University (1997) Chap. 4
    • (1997)
    • Hirayama, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.