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Volumn 42, Issue 4 B, 2003, Pages 1887-1891
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A new microwave-excited plasma etching equipment for separating plasma excited region from etching process region
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Author keywords
Excess decomposition; Microwave excited plasma; Reactive ion etching; RLSA; Shower head; SiO2 etching
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Indexed keywords
DECOMPOSITION;
ELECTRONS;
EQUIPMENT;
FLUORINE COMPOUNDS;
IONS;
MICROWAVES;
PLASMA DENSITY;
PLASMA SOURCES;
SILICA;
SLOT ANTENNAS;
TEMPERATURE;
EXCESS DECOMPOSITION;
HIGH-DENSITY PLASMA SOURCE;
LOW-ELECTRON TEMPERATURE;
MICROWAVE-EXCITED PLASMA ETCHING EQUIPMENT;
RADIAL LINE SLOT ANTENNA;
SHOWER HEAD;
PLASMA ETCHING;
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EID: 0038348100
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.42.1887 Document Type: Article |
Times cited : (38)
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References (8)
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