Measurement of illite particle thickness using a direct Fourier transform of small-angle X-ray scattering data

Clays and Clay Minerals

Volumn 51, Issue 3, 2003, Pages 293-300

  Shang, Chao ^a   Rice, James A ^a   Eberl, Dennis D ^b   Lin, Jar Shyong ^c  

^a SOUTH DAKOTA STATE UNIVERSITY   (United States)

^b U S GEOLOGICAL SURVEY   (United States)

^c Environmental Sciences Division   (United States)

Author keywords

Direct Fourier transform; Fundamental particle; Illite; Particle thickness; SAXS

Indexed keywords

FOURIER TRANSFORMS; FUNCTIONS; PARTICLE SIZE ANALYSIS; X RAY SCATTERING;

SMECTITE;

MINERAL RESOURCES;

CLAY MINERAL; CRYSTAL STRUCTURE; ILLITE; SCATTERING; X-RAY;

EID: 0038346450     PISSN: 00098604     EISSN: None     Source Type: Journal    
DOI: 10.1346/CCMN.2003.0510305     Document Type: Article

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