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Volumn 50, Issue 5, 2002, Pages 562-577

Thickness distribution of illite crystals in shales. I: X-ray diffraction vs. high-resolution transmission electron microscopy measurements

Author keywords

BWA analysis; Crystal size distribution; Fundamental particles; HRTEM; Illite smectite; Lognormal distribution; MudMaster; XRD

Indexed keywords

CRYSTALS; POLYMERS; THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 0036803288     PISSN: 00098604     EISSN: None     Source Type: Journal    
DOI: 10.1346/000986002320679305     Document Type: Article
Times cited : (29)

References (29)
  • 12
  • 28
    • 0022861276 scopus 로고
    • Expanding behaviour, structural disorder, regular and random irregular interstratification of 2:1 layer-silicates studied by high-resolution images of transmission electron microscopy
    • (1986) Clay Minerals , vol.21 , pp. 827-859
    • Vali, H.1    Köster, H.M.2
  • 29
    • 14744282786 scopus 로고    scopus 로고
    • Crystallite thickness and defect density of phyllosilicates in low-temperature metamorphic pelites: A TEM and XRD study of clay mineral crystallinity index standards
    • (1998) The Canadian Mineralogist , vol.36 , pp. 1453-1474
    • Warr, L.N.1    Nieto, F.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.