Measurement of fundamental illite particle thicknesses by X-ray diffraction using PVP-10 intercalation

Clays and Clay Minerals

Volumn 46, Issue 1, 1998, Pages 89-97

  Eberl, D D ^a   Nuesch R ^b   Sucha, V ^c   Tsipursky, S ^d  

^a U S GEOLOGICAL SURVEY   (United States)

^b ETH ZURICH   (Switzerland)

^c Physics and Informatics   (Slovakia)

^d Nanocor   (United States)

Author keywords

Bertaut; Fundamental Illite Particles; Illite; Illite Smectite; Mixed Layering; Peak Broadening; Polyvinylpyrrolidone; Warren Averbach; X ray Diffraction

Indexed keywords

ILLITE; PARTICLE SIZE; XRD;

INTERCALATION COMPOUNDS; MOLECULAR WEIGHT; MONOCHROMATORS; PARTICLES (PARTICULATE MATTER); SILICON WAFERS; STRAIN; SWELLING; THICKNESS MEASUREMENT; VINYL RESINS; X RAY DIFFRACTION ANALYSIS;

BERTAUT WARREN AVERBACH (BWA) TECHNIQUE; DIAGENESIS; GAUSSIAN DISTRIBUTION; HYDROTHERMAL GROWTH; ILLITE; INTEGRAL PEAK WIDTH METHOD; METAMORPHISM; POLYVINYLPYRROLIDONE; SMECTITE;

CLAY MINERALS;

EID: 0031597217     PISSN: 00098604     EISSN: None     Source Type: Journal    
DOI: 10.1346/CCMN.1998.0460110     Document Type: Article

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