XRD measurement of mean thickness, thickness distribution and strain for illite and illite-smectite crystallites by the Bertaut-Warren-Averbach technique

Clays and Clay Minerals

Volumn 46, Issue 1, 1998, Pages 38-50

  Drits, V A ^a   Eberl, D D ^b   Srodon J ^c  

^a GEOLOGICAL INSTITUTE   (Russian Federation)

^b U S GEOLOGICAL SURVEY   (United States)

^c INSTITUTE OF GEOLOGICAL SCIENCES   (Poland)

Author keywords

Crystallite; Fundamental Illite Particles; Illite; Illite Smectite; MacEwan Crystallites; Mixed Layer Clay; Thickness Distributions; Warren Averbach Method

Indexed keywords

CRYSTAL STRUCTURE; DEHYDRATION; HEATING; SATURATION (MATERIALS COMPOSITION); STRAIN MEASUREMENT; SWELLING; THERMAL EFFECTS; THICKNESS MEASUREMENT; X RAY CRYSTALLOGRAPHY;

BERTAUT WARREN AVERBACH (BWA) TECHNIQUE; COHERENT SCATTERING DOMAINS (CSD); ILLITE; MACEWAN CRYSTALLITES; SMECTITE;

CLAY MINERALS;

ILLITE; ILLITE-SMECTITE; STRAIN; XRD;

EID: 0031597212     PISSN: 00098604     EISSN: None     Source Type: Journal    
DOI: 10.1346/CCMN.1998.0460105     Document Type: Article

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