XRD measurement of mean crystallite thickness of illite and illite/smectite: Reappraisal of the Kubler index and the Scherrer equation

Clays and Clay Minerals

Volumn 45, Issue 3, 1997, Pages 461-475

  Drits, Victor ^a   Środoń, Jan ^b   Eberl, D D ^c  

^a GEOLOGICAL INSTITUTE   (Russian Federation)

^b INSTITUTE OF GEOLOGICAL SCIENCES   (Poland)

^c DENVER FEDERAL CENTER   (United States)

Author keywords

Crystal Thickness; Illite; Illite Smectite; Kubler Index; Mixed Layer Crystals; Scherrer Equation; XRD

Indexed keywords

COMPUTATIONAL METHODS; COMPUTER SIMULATION; CRYSTALS; PARTICLES (PARTICULATE MATTER); THICKNESS MEASUREMENT; X RAY CRYSTALLOGRAPHY;

COHERENT SCATTERING DOMAIN (CSD); CRYSTAL THICKNESS; ILLITE; KUBLER INDEX; SCHERRER EQUATION; SMECTITE;

CLAY MINERALS;

CRYSTAL THICKNESS; ILLITE; KUBLER INDEX; SCHERRER EQUATION; SMECTITE; XRD;

EID: 0031156231     PISSN: 00098604     EISSN: None     Source Type: Journal    
DOI: 10.1346/CCMN.1997.0450315     Document Type: Article

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