Image resolution and contrast of scanning near-field optical microscope: A review

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3467, Issue , 1998, Pages 2-7

  Lim, Tuan Kay ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

Near field optics; Scanning microscope; Scanning near field microscope

Indexed keywords

COMPUTER SIMULATION; DETECTORS; IMAGE QUALITY; LIGHT POLARIZATION; LIGHT REFLECTION; LIGHT TRANSMISSION; PROBES; SCANNING; TRANSFER FUNCTIONS;

APERTURE SIZE; PROBE SAMPLE INTERACTION; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

OPTICAL MICROSCOPY;

EID: 0038336220     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.326814     Document Type: Conference Paper

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