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Journal of Applied Physics

Volumn 83, Issue 11, 1998, Pages 7061-7063

Scanning magnetoresistance microscopy of La0.67Sr 0.33MnO3 films

(5) Petrov, D K a Gupta, A a Kirtley, J R a Krusin Elbaum, L a Gill, H S b

a IBM T J WATSON RESEARCH CENTER (United States)

b IBM (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; MAGNETIC DOMAINS; MAGNETIC FIELDS; MAGNETIZATION; MAGNETORESISTANCE; OXIDE SUPERCONDUCTORS; SCANNING ELECTRON MICROSCOPY; SURFACE STRUCTURE; THERMAL EFFECTS; TRANSPORT PROPERTIES;

COLOSSAL MAGNETORESISTANCE; MAGNETOTRANSPORT; SCANNING MAGNETORESISTANCE MICROSCOPY;

MAGNETIC THIN FILMS;

EID: 0032095097 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.367640 Document Type: Article

Times cited : (14)

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