|
Volumn 23, Issue 1-2, 2003, Pages 113-116
|
SiC heteroepitaxial growth by low pressure chemical vapor deposition on Si(1 1 1) substrates
|
Author keywords
Heteroepitaxial growth; Low pressure chemical vapor deposition (LPCVD); Silicon carbide (SiC)
|
Indexed keywords
ATOMIC FORCE MICROSCOPY;
AUGER ELECTRON SPECTROSCOPY;
CHEMICAL VAPOR DEPOSITION;
COMPOSITION;
EPITAXIAL GROWTH;
ETHANE;
FILM GROWTH;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
HYDROGEN;
MORPHOLOGY;
PRESSURE EFFECTS;
SILANES;
SILICON;
SINGLE CRYSTALS;
STOICHIOMETRY;
THERMAL EFFECTS;
HETEROEPITAXIAL GROWTH;
SILICON CARBIDE;
|
EID: 0038010649
PISSN: 09253467
EISSN: None
Source Type: Journal
DOI: 10.1016/S0925-3467(03)00070-3 Document Type: Conference Paper |
Times cited : (9)
|
References (15)
|