Processing and microstructural characterization of sputter-deposited Ni/Ni3Al multilayered thin films

Journal of Materials Research

Volumn 18, Issue 4, 2003, Pages 979-987

  Sperling, Evan A ^a   Banerjee, Rajarshi ^a   Thompson, Gregory B ^a   Fain, Jason P ^a   Anderson, Peter M ^a   Fraser, Hamish L ^a  

^a OHIO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; INTERFACES (MATERIALS); MICROSTRUCTURE; MULTILAYERS; NICKEL COMPOUNDS; PHASE DIAGRAMS; SINGLE CRYSTALS; SPUTTER DEPOSITION; SUBSTRATES; TEXTURES; THERMODYNAMIC STABILITY;

COHERENCY STRESS;

THIN FILMS;

EID: 0038004859     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2003.0134     Document Type: Article

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