Chemical ordering and texture in Ni-25 at% Al thin films

Acta Materialia

Volumn 50, Issue 3, 2002, Pages 643-651

  Thompson, G B ^a   Banerjee, R ^a   Zhang, X D ^a   Anderson, P M ^a   Fraser, H L ^a  

^a Ohio State University   (United States)

Author keywords

Intermetallic compounds; Phase transformations (ordering); Recrystallization recovery; Sputtering; Thin films

Indexed keywords

ALUMINUM; INTERMETALLICS; OXIDATION; SILICON; SPUTTER DEPOSITION; SUBSTRATES; TEXTURES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

CHEMICAL ORDERING;

THIN FILMS;

EID: 0037039679     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(01)00373-1     Document Type: Article

References (14)