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Volumn 44, Issue 11, 2001, Pages 2629-2633
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Influence of crystallographic orientation and layer thickness on fracture behavior of Ni/Ni3Al multilayered thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
BRITTLE FRACTURE;
CRYSTAL ORIENTATION;
CRYSTALLOGRAPHY;
DUCTILE FRACTURE;
EPITAXIAL GROWTH;
MAGNETRON SPUTTERING;
METALLIC SUPERLATTICES;
MULTILAYERS;
NICKEL;
NICKEL ALLOYS;
PLASTIC DEFORMATION;
SODIUM CHLORIDE;
SPUTTER DEPOSITION;
SUPERALLOYS;
NICKEL ALUMINIDE;
METALLIC FILMS;
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EID: 0035364050
PISSN: 13596462
EISSN: None
Source Type: Journal
DOI: 10.1016/S1359-6462(01)00966-6 Document Type: Article |
Times cited : (15)
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References (5)
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