Scanning apertureless microscopy below the diffraction limit: Comparisons between theory and experiment

Applied Physics Letters

Volumn 75, Issue 25, 1999, Pages 4022-4024

  Hill, C J ^a   Bridger, P M ^a   Picus, G S ^a   McGill, T C ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001677702     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125525     Document Type: Article

References (5)

1. H. K. Wickramasinghe and C. C. Williams, Apertureless Near Field Optical Microscope, U.S. Patent No. 4,947,034 (April 28, 1989).
2. F. Zenhausern, M. P. O'Boyle, and H. K. Wickramasinghe, Appl. Phys. Lett. 65, 1623 (1994).
3. B. Hecht, H. Bielefeldt, Y. Inouye, L. Novotny, and D. W. Pohl, J. Appl. Phys. 81, 2492 (1997).
4. P. M. Bridger and T. C. McGill, Opt. Lett. 24, 1005 (1999).
5. J. D. Jackson, Classical Electrodynamics, 2nd ed. (Wiley, New York, 1975).