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Volumn 18, Issue 6, 2003, Pages 1474-1480

Residual strain field in indented GaAs

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPRESSIVE STRESS; CRYSTAL ORIENTATION; CRYSTAL SYMMETRY; DEFORMATION; INDENTATION; PHONONS; PHOTOLUMINESCENCE; RAMAN SCATTERING; STRAIN MEASUREMENT; STRESS RELAXATION; TENSILE TESTING;

EID: 0038000059     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2003.0203     Document Type: Article
Times cited : (10)

References (22)
  • 9
    • 85039665135 scopus 로고    scopus 로고
    • Unpublished test measurements obtained with Dilor and Renishaw spectrometers, (2003)
    • Unpublished test measurements obtained with Dilor and Renishaw spectrometers, P. Puech, (2003).
    • Puech, P.1
  • 21
    • 85039670880 scopus 로고    scopus 로고
    • Downloadable
    • Downloadable at www.lpst.ups-tlse.fr/users/pascal.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.