Measurement of porous silicon thermal conductivity by micro-Raman scattering

Journal of Applied Physics

Volumn 86, Issue 8, 1999, Pages 4700-4702

  Perichon S ^a   Lysenko, V ^a   Remaki, B ^a   Barbier, D ^a   Champagnon, B ^b  

^a INSTITUT DES NANOTECHNOLOGIES DE LYON   (France)

^b UNIVERSITÉ LYON 1   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0037976534     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371424     Document Type: Article

References (23)

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