Characterisation of nanocrystals by scanning capacitance force microscopy

Materials Research Society Symposium - Proceedings

Volumn 738, Issue , 2003, Pages 171-176

  Tallarida, Grazia ^a   Spiga, Sabina ^a   Fanciull, Marco ^a  

^a LABORATORIO MDM   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CAPACITANCE; ELECTRIC FIELD EFFECTS; NANOSTRUCTURED MATERIALS; TIN;

NANOCRYSTALS;

CRYSTALS;

EID: 0037973549     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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