ESD challenges in magnetic recording: Past, present and future

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2003, Pages 222-228

  Wallash, Al ^a  

^a MAXTOR CORPORATION   (United States)

Author keywords

AMR; Electrical breakdown; Electrostatic discharge; ESD; ESD control; GMR; Magnetic recording head; Modified Paschen curve; MR; TMR

Indexed keywords

ELECTRIC BREAKDOWN; ELECTRIC POTENTIAL; ELECTROSTATIC DEVICES; GIANT MAGNETORESISTANCE; MAGNETIC FIELDS;

SPINDLE MOTORS;

MAGNETIC RECORDING;

EID: 0037972828     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)

1. C. Dennis Mee and Eric D. Daniel, Magnetic Recording Technology, McGrawHill, 1990. Ch. 6.
2. A. Wallash, T. Hughbanks and S. Voldman, "ESD Failure Mechanisms of Inductive and Magnetoresistive Recording Heads", in Proc. EOS/ESD Symp. 1995, pp. 322-29.
3. Edgar M. Williams, Design and Analysis of Magnetoresistive Recording Heads, John Wiley and Sons, Inc, 2001, pp. Ch. 4, p. 82. See also Ref. 1, Ch. 6, p. 6.5.
4. A. Wallash and Y.K. Kim, "Electrostatic discharge sensitivity of giant magnetoresistive recording heads", J. Appl. Phys, 81 (8), April 15, 1997, pp. 4921-3.
5. H. Tian and J.K. Lee, "BSD Damage to MR Heads", IEEE Trans. Magn., Vol. 31, 1995, pp. 2624.
6. A. Wallash, "Standardized ESD Test for Magnetoresistive Recording Heads", IEEE Trans. Magn., Vol. 33, No. 5, September 1997, pp. 2911-3.
7. A. Wallash and M. Honda, "Field-induced breakdown ESD damage of magnetoresistive recording heads", Journal of Electrostatics 44 (1988) 257-265.
8. Ref.3, Ch. 6, p. 159.
9. A. Wallash and Y.K. Kim, "Magnetic Changes in GMR Heads caused by electrostatic discharge", IEEE Trans. Magn. 34, 1519 (1998).
10. M. Takahashi, T. Maeda, K. Inage, M. Sakai, H. Morita and M. Matsuzuki, IEEE Trans. Magn. 34, 1522 (1998).
11. A. Wallash, "A New Early Failure Phenomenon in ESD Damaged GMR Recording Heads," To be published in Proc. Of Magnetism and Magnetic Materials conference, 2002.
12. L. Baril, T. Cheung and A. Wallash, "Standardized Direct Charged Device Model ESD Test for MR Recording Heads", in Proc. EOS/ESD Symp. 2002, pp. 306-320.
13. J. Himle and A. Wallash, "Tribocharging and Electrical Breakdown at the Magnetic Recording Head-Disk Interface", in Proc. EOS/ESD Symp. 2002, pp. 142-7.
14. F. Paschen, 1889 Wied. Ann 37, pp. 69-96.
15. A. Wallash and L. Levit, "Electrical breakdown and ESD phenomena for devices with nanometer-to-micron gaps", in Proceedings of the Reliability, Testing and Characterization of MEMS/MEOMS II, SPIE Conference, January 2003, paper 4980-10.
16. R.M. Schaffert, ELECTROPHOTOGRAPHY, John Wiley and Sons, 1975, p.514, or the 1965, Focal Press Limited version, pp. 319-23.
17. L. Baril, M. Nichols and A. Wallash, "Degradation of GMR and TMR Recording Heads using very short duration ESD transients", IEEE Transactions on Magnetics, September 2002.