Tribocharging and electrical breakdown at the magnetic recording head-disk interface

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn 2002-January, Issue , 2002, Pages 142-146

  Himle, Jenny ^a   Wallash, Al ^a  

^a MAXTOR CORPORATION   (United States)

Author keywords

Aluminum; Breakdown voltage; Conductors; Contacts; Current measurement; Electric breakdown; Electric variables measurement; Electrostatic discharge; Glass; Magnetic recording

Indexed keywords

ALUMINUM; CONTACTS (FLUID MECHANICS); ELECTRIC BREAKDOWN; ELECTRIC BREAKDOWN OF LIQUIDS; ELECTRIC CONDUCTORS; ELECTRIC CURRENT MEASUREMENT; ELECTRIC DISCHARGES; ELECTRIC VARIABLES MEASUREMENT; ELECTROSTATIC DEVICES; ELECTROSTATIC DISCHARGE; GLASS; HARD DISK STORAGE; MAGNETIC DISK STORAGE; MAGNETIC RECORDING; NONVOLATILE STORAGE; SPIN GLASS;

DISK BREAKDOWN; ELECTRICAL BREAKDOWN; ELECTRICAL BREAKDOWN VOLTAGE; GMR SENSORS; HEAD DISK INTERFACE; HEAD-DISK CONTACT; MAGNETIC RECORDING HEADS; TRIBOCHARGING;

ELECTRIC GROUNDING;

EID: 84948752281     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. Z. Feng, C. Shih, V. Gubbi and F. Poon, A study of tribo-charge/emission at the head-disk interface, J. Appl. Physics, Vol. 85, No. 8, April 15, 1999, pp 5615-17.
2. Schaffert R.M., ELECTROPHOTOGRAPHY, 1966, p. 321.
3. A. Wallash and T. Hughbanks, "Capacitive Coupling Effects in Spark Gap Devices", 1994 EOS/ESD Symp. Proc., pp. 273-8.
4. T. Ohtsu, H. Yoshida, N. Hatanaka, Field Emission Noise Caused by Capacitance Coupling ESD in AMR/GMR heads, 2001 EOS/ESD Symp. Proc., EOS-23, pp.172-4.
5. L. Pust, C.J.T. Rea, S. Gangapadhyay, IEEE Trans. Magn. 38, (2002).