Standardized ESD test for magnetoresistive recording heads

IEEE Transactions on Magnetics

Volumn 33, Issue 5 PART 1, 1997, Pages 2911-2913

  Wallash, Albert J ^a  

^a MAXTOR CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN OF GASES; ELECTRIC CORONA; ELECTRIC DISCHARGES; ELECTROSTATICS; MAGNETIC RECORDING; MAGNETORESISTANCE; SENSORS; VOLTAGE MEASUREMENT;

ELECTROSTATIC DISCHARGES (ESD); HUMAN BODY MODEL;

MAGNETIC HEADS;

EID: 0031223466     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.617795     Document Type: Article

References (8)

1. A. Wallash and T. Hughbanks, "Capacitive Coupling Effects in Spark Gap Devices", 1994 EOS/ESD Symp. Proc., pp. 273-8.
2. H. Tian and J.K. Lee, "BSD Damage to MR Heads", IEEE Trans. Magn. 31,2624(1995).
3. A. Wallash, T. Hughbanks and S. Voldman, "BSD Failure Mechanisms of Inductive and Magnetoresistive Recording Heads", Proc. 17th EOS/ESD Symp. Proc., 1995, pp. 322-30.
4. A. Wallash, "Electrostatic Modeling and BSD Damage of Magnetoresistive Sensors", IEEE Trans. Magn., 32, 49-53 (1996).
5. T. Cheung and A. Rice, "An Investigation of BSD Protection for MR Recording Heads", 1996 EOS/ESD Symp. Proc., pp. 1-7.
6. EOS/ESD Association Standard for BSD Sensitivity Testing (Human Body Model (HBM) Component Level) ANSI/EOS/ESDS5.1-1993, BSD Association, 200 Liberty Plaza, Rome, NY.
7. ORYX Technologies, Fremont CA. (510) 249-1144. Attn. Mark Guillaume
8. A. Wallash, "Field Induced Charged Device Model Testing of Magnetoresistive Recording Heads", 1996 EOS/ESD Symp. Proc., pp. 8-13.