Degradation of GMR and TMR recording heads using very-short-duration ESD transients

IEEE Transactions on Magnetics

Volumn 38, Issue 5 I, 2002, Pages 2283-2285

  Baril, Lydia ^a   Nichols, Mark ^a   Wallash, Albert ^a  

^a MAXTOR CORPORATION   (United States)

Author keywords

Charged device model (CDM); ESD; Giant magnetoresistive (GMR); Tunneling magnetoresistive (TMR)

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; GIANT MAGNETORESISTANCE; MAGNETIC HEADS;

CHARGE DEVICE MODELS (CDM);

MAGNETIC RECORDING;

EID: 0036761754     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2002.802803     Document Type: Article

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