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Volumn 120-121, Issue 1-8, 1999, Pages 347-352

Combination of emission channeling, photoluminescence and Mössbauer spectroscopy to identify rare earth defect complexes in semiconductors

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0037948740     PISSN: 03043843     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (2)

References (26)
  • 2
    • 0027915723 scopus 로고    scopus 로고
    • Rare Earth Doped Semiconductors II
    • G.S. Pomrenke, P.B. Klein and D.W. Lander, eds., Rare Earth Doped Semiconductors, Math. Res. Soc. Proc. 301 (1993); S. Coffa, A. Polman and R.N. Schwartz, eds., Rare Earth Doped Semiconductors II, Math. Res. Soc. Proc. 422 (1996).
    • (1996) Math. Res. Soc. Proc. , pp. 422
    • Coffa, S.1    Polman, A.2    Schwartz, R.N.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.