Dephasing due to background charge fluctuations

Physical Review B - Condensed Matter and Materials Physics

Volumn 67, Issue 19, 2003, Pages 1953201-1953209

  Itakura, Toshifumi ^a   Tokura, Yasuhiro ^a  

^a Kashino Diverse Brain Research Laboratory of NTT Communication Science Laboratories   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; DEGRADATION; ELECTRICITY; ELEMENTARY PARTICLE; MATHEMATICAL ANALYSIS; NOISE; QUANTUM MECHANICS;

EID: 0037826925     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.67.195320     Document Type: Article

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