Simulation of the depolarization effect in porous silicon

Applied Optics

Volumn 42, Issue 7, 2003, Pages 1211-1215

  Jun, Kyung Hoon ^a   Lim, Koeng Su ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELLIPSOMETRY; LIGHT POLARIZATION; NANOSTRUCTURED MATERIALS; POROUS SILICON; SEMICONDUCTOR MATERIALS; SPECTROSCOPIC ANALYSIS;

DEPOLARIZATION;

LIGHT SCATTERING;

EID: 0037821409     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.42.001211     Document Type: Article

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