Ellipsometric investigation of thick polymer films

Thin Solid Films

Volumn 313-314, Issue , 1998, Pages 808-813

  Forcht, K ^a   Gombert, A ^a   Joerger, R ^a   Kohl M ^a  

^a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

Author keywords

Anisotropic thick film; Mueller matrix of anisotropic samples; Polymer film; Transmission ellipsometry

Indexed keywords

ANISOTROPY; ELLIPSOMETRY; LIGHT POLARIZATION; LIGHT REFLECTION; LIGHT TRANSMISSION; OPTICAL PROPERTIES; PHOTOMETRY; THICK FILMS;

MUELLER MATRIX; TRANSMISSION ELLIPSOMETRY;

PLASTIC FILMS;

EID: 0032002824     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)01000-6     Document Type: Article

References (10)

1. G.F. Harding, in: G.H. Meeten (Ed.), Optical Properties of Polymers, Elsevier Applied Science, London and New York, 1986, Chapter 2.
2. A. Röseler, Infrared Spectroscopic Ellipsometry, Akademie-Verlag, Berlin, 1990, p. 57.
3. A. Röseler, J. Opt. Soc. Am. A 9 (1992) 1124.
4. G.E. Jellison, Jr., J.W. McCamy, Appl. Phys. Lett. 61 (1992) 512.
5. S.-M.F. Nee, Appl. Opt. 35 (1996) 3570.
6. K. Kim, L. Mandel, E. Wolf, J. Opt. Soc. Am. A 4 (1987) 433.
7. K. Forcht, A. Gombert, R. Joerger, M. Köhl, Thin Solid Films 302 (1997) 43.
8. P.S. Hauge, J. Opt. Soc. Am. 68 (1978) 1519.
9. R. Joerger, K. Forcht, A. Gombert, M. Kohl, W. Graf, Appl. Opt. 36 (1997) 319.
10. R.M.A. Azzam, N.M. Bashara, Ellipsometry and Polarized Light, North-Holland, Amsterdam, 1987, p. 332.