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Volumn , Issue , 2003, Pages 567-570

Development of 50 mm diameter non-polar gallium nitride substrates for device applications

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; ETCHING; LIGHT EMITTING DIODES; MOLECULAR BEAM EPITAXY; SEMICONDUCTOR QUANTUM WELLS; SUBSTRATES; VAPOR PHASE EPITAXY; FILMS; GALLIUM ALLOYS; GALLIUM NITRIDE; GROWTH (MATERIALS); INDIUM; INDIUM PHOSPHIDE; MOLECULAR BEAMS; NITRIDES; NITROGEN; NITROGEN PLASMA; OPTICAL FILMS; PHOTONIC CRYSTALS; SEMICONDUCTOR GROWTH; SEMICONDUCTOR MATERIALS; SILICON WAFERS; STACKING FAULTS; WET ETCHING;

EID: 0037810733     PISSN: 10928669     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (3)

References (11)
  • 2
    • 0001689993 scopus 로고    scopus 로고
    • Macroscopic polarization and band offsets at nitride heterojunctions
    • F. Bernardini and V. Fiorentini, "Macroscopic polarization and band offsets at nitride heterojunctions," Phy. Rev., B57, R9427 (1998).
    • (1998) Phy. Rev. , vol.B57
    • Bernardini, F.1    Fiorentini, V.2
  • 5
    • 0000504163 scopus 로고
    • Czochralski growth of single crystal lithium aluminate
    • B. Cockayne and B. Lent, "Czochralski growth of single crystal lithium aluminate," J. Crystal Growth, 54, 546 (1981).
    • (1981) J. Crystal Growth , vol.54 , pp. 546
    • Cockayne, B.1    Lent, B.2
  • 6
    • 0014595810 scopus 로고
    • The preparation and properties of vapor-deposited single-crystalline GaN
    • H.P. Maruska, J.J. Tietjen, "The Preparation and Properties of Vapor-Deposited Single-Crystalline GaN" Appl. Phys. Lett. 15 327 (1969)
    • (1969) Appl. Phys. Lett. , vol.15 , pp. 327
    • Maruska, H.P.1    Tietjen, J.J.2
  • 8
    • 0038311974 scopus 로고    scopus 로고
    • personal communication
    • J. S. Speck, personal communication.
    • Speck, J.S.1
  • 10
    • 0038929135 scopus 로고    scopus 로고
    • The {1010} inversion domains in GaN/sapphire layers: An electron microscopy analysis of the atomic structure at boundaries
    • (Dec)
    • V Potin, G Nouet, P Ruterana, "The {1010} inversion domains in GaN/sapphire layers: an electron microscopy analysis of the atomic structure at boundaries," Phil. Mag., 79, 2899 (Dec 1999).
    • (1999) Phil. Mag. , vol.79 , pp. 2899
    • Potin, V.1    Nouet, G.2    Ruterana, P.3
  • 11
    • 0343828805 scopus 로고    scopus 로고
    • Polarity determination for GaN films grown on (0001) sapphire and high-pressure grown GaN single crystals
    • J. L. Rouviere, J. L. Weyher, M. Seelmann-Eggebert, S. Porowski, "Polarity determination for GaN films grown on (0001) sapphire and high-pressure grown GaN single crystals," Appl Phys Lett, 73, 668 (1998).
    • (1998) Appl Phys Lett , vol.73 , pp. 668
    • Rouviere, J.L.1    Weyher, J.L.2    Seelmann-Eggebert, M.3    Porowski, S.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.