Non-invasive measurement of chip currents in IGBT modules

PESC Record - IEEE Annual Power Electronics Specialists Conference

Volumn 1, Issue , 1997, Pages 166-171

  Palmer, Patrick R ^a   Stark, Bernard H ^a   Joyce, John C ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; BIPOLAR INTEGRATED CIRCUITS; ELECTRIC CURRENT DISTRIBUTION; ELECTRIC CURRENT MEASUREMENT; ELECTRIC NETWORK PARAMETERS; ELECTRIC NETWORK TOPOLOGY; MAGNETIC FIELDS; SWITCHING THEORY;

INSULATED GATE BIPOLAR TRANSISTORS (IGBT);

BIPOLAR TRANSISTORS;

EID: 0030673413     PISSN: 02759306     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)