Dependence of the pyroelectric response on internal stresses in ferroelectric thin films

Applied Physics Letters

Volumn 82, Issue 20, 2003, Pages 3499-3501

  Ban, Z G ^a   Alpay, S P ^a  

^a UNIVERSITY OF CONNECTICUT   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; INFRARED DETECTORS; PARTICLE DETECTORS; PHASE TRANSITIONS; PHOTONS; PYROELECTRICITY; RESIDUAL STRESSES; STRAIN; TENSILE STRENGTH;

EPITAXIAL THIN FILMS;

FERROELECTRIC THIN FILMS;

EID: 0037643535     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1576503     Document Type: Article

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