Structural study of the Al/Ni interface in ultrathin polycrystalline multilayers

Journal of Applied Physics

Volumn 93, Issue 10 1, 2003, Pages 5937-5944

  Fonda, E ^a   Petroff, F ^a,b   Traverse, A ^a  

^a UNIVERSITÉ PARIS SACLAY   (France)

^b CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ALUMINUM; DEPOSITION; DIFFUSION; MAGNETIC VARIABLES MEASUREMENT; MULTILAYERS; NICKEL; POLYCRYSTALLINE MATERIALS;

POLYCRYSTALLINE MULTILAYERS;

INTERFACES (MATERIALS);

EID: 0037636585     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1565174     Document Type: Article

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