Alloy formation at the Ni-Al interface for nickel films deposited on Al(110) surfaces

Surface Science

Volumn 450, Issue 3, 2000, Pages 204-226

  Shutthanandan, V ^a   Saleh, Adli A ^a   Smith, R J ^a  

^a MONTANA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; DEPOSITION; DIFFUSION IN SOLIDS; FILM GROWTH; INTERFACES (MATERIALS); ION BEAMS; METALLIC FILMS; MONOLAYERS; MONTE CARLO METHODS; NICKEL; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

EMBEDDED-ATOM METHOD (EAM); HIGH-ENERGY ION SCATTERING (HEIS);

ALUMINUM;

EID: 0033894179     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00050-9     Document Type: Article

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