Structural characterization of Ni-Al (111) interface by surface x-ray absorption spectroscopy

Journal of Applied Physics

Volumn 92, Issue 4, 2002, Pages 1862-1867

  Damoc, L ^a   Fonda, E ^a   Le Fevre, P ^a   Traverse, A ^a  

^a SYNCHROTRON SOLEIL   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINIDES; DIFFUSION LENGTH; IN-SITU; NI FILMS; PHASE FORMS; ROOM TEMPERATURE; STRUCTURAL CHARACTERIZATION;

MONOLAYERS; X RAY ABSORPTION SPECTROSCOPY;

ALUMINUM;

EID: 0037103675     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1493652     Document Type: Article

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