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Volumn 253, Issue 1-4, 2003, Pages 89-94
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Structural characterization of epitaxial Cd1-xZnxTe semiconductor thin films by ion beam techniques
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NONE
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Author keywords
A1. Characterization; A3. Vapor phase epitaxy; B1. Alloys; B2. Semiconducting II VI materials
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Indexed keywords
COMPOSITION;
CONTAMINATION;
ION BEAM ASSISTED DEPOSITION;
ISOTHERMS;
PHASE INTERFACES;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SEMICONDUCTING CADMIUM TELLURIDE;
SEMICONDUCTING FILMS;
VAPOR PHASE EPITAXY;
NUCLEAR REACTIONS;
THIN FILMS;
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EID: 0037610942
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(03)01023-6 Document Type: Article |
Times cited : (1)
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References (16)
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