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Volumn 253, Issue 1-4, 2003, Pages 89-94

Structural characterization of epitaxial Cd1-xZnxTe semiconductor thin films by ion beam techniques

Author keywords

A1. Characterization; A3. Vapor phase epitaxy; B1. Alloys; B2. Semiconducting II VI materials

Indexed keywords

COMPOSITION; CONTAMINATION; ION BEAM ASSISTED DEPOSITION; ISOTHERMS; PHASE INTERFACES; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTING FILMS; VAPOR PHASE EPITAXY;

EID: 0037610942     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(03)01023-6     Document Type: Article
Times cited : (1)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.