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Volumn 306, Issue 2, 1997, Pages 266-270

Ultrahigh vacuum atomic layer epitaxy of Cd1-xMnxTe layers grown on ZnTe/GaAs(100) substrates: Reflection mass spectrometry studies

Author keywords

Atomic layer epitaxy; Reflection mass spectrometry; Thin film growth in ultrahigh vacuum

Indexed keywords

FILM GROWTH; MASS SPECTROMETRY; MOLECULAR BEAM EPITAXY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING ZINC COMPOUNDS; SUBSTRATES; SURFACE STRUCTURE; THIN FILMS;

EID: 0031220818     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00236-8     Document Type: Article
Times cited : (8)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.