Depth profiling of inhomogeneous zirconia films by optical and Rutherford backscattering spectrometric techniques

Journal of Physics D: Applied Physics

Volumn 32, Issue 4, 1999, Pages 388-394

  Khawaja, E E ^a   Durrani, S M A ^a   Daous, M A ^a  

^a KING FAHD UNIVERSITY OF PETROLEUM AND MINERALS   (Saudi Arabia)

Author keywords

[No Author keywords available]

Indexed keywords

DENSITY (SPECIFIC GRAVITY); EVAPORATION; REFLECTOMETERS; REFRACTIVE INDEX; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SPECTROPHOTOMETERS; SUBSTRATES; THERMAL EFFECTS; ZIRCONIA; THIN FILMS;

COLUMNAR STRUCTURE; INHOMOGENEOUS ZIRCONIA FILMS; OPTICAL INHOMOGENEITY; OPTICAL SPECTROSCOPY; TRANSMITTANCE; TRANSPARENT SUBSTRATE; DEPTH PROFILING;

THIN FILMS; ZIRCONIA;

EID: 0033068261     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/32/4/006     Document Type: Article

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