Physical chemistry of the femtosecond and nanosecond laser-material interaction with SiC and a SiC-TiC-TiB 2 composite ceramic compound

Applied Surface Science

Volumn 208-209, Issue 1, 2003, Pages 285-291

  Rudolph, Pascale ^a   Brzezinka, Klaus Werner ^a   Wäsche, Rolf ^a   Kautek, Wolfgang ^a  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

Author keywords

Ceramics; Femtosecond techniques; Nanosecond techniques; Raman spectra condensed matter; XPS surface analysis

Indexed keywords

CERAMIC MATRIX COMPOSITES; CRYSTAL STRUCTURE; MELTING; OXIDATION; SILICON CARBIDE; SURFACE CHEMISTRY; LASER BEAM EFFECTS; LASER PULSES; MORPHOLOGY; RAMAN SPECTROSCOPY; SOLIDIFICATION; SURFACE PROPERTIES; X RAY PHOTOELECTRON SPECTROSCOPY;

FEMTOSECOND TECHNIQUES; THRESHOLD FLUENCES;

LASER PULSES; CERAMIC MATRIX COMPOSITES;

EID: 0037443170     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)01356-9     Document Type: Conference Paper

References (19)

1. A.W. Weimer (Ed.), Carbide, Nitride and Boride Materials Synthesis and Processing, Chapman & Hall, London, 1997.
2. Wäsche R., Klaffke D. Tribol. Lett. 5:1998;173.
3. Wäsche R., Rabe T. Ceram. Trans. 99:1998;537.
4. J.P. Singh, N.P. Bansal, E. Ustundag (Ed.), Ceramic Matrix Composites VI, Ceramic Transactions, The American Ceramic Society, vol. 124, 2001, p. 185.
5. Liu J.M. Opt. Lett. 7:1982;196.
6. Jandeleit J., Horn A., Weichenhain R., Kreutz E.W., Poprawe R. Appl. Surf. Sci. 127-129:1998;885.
7. Bonse J., Rudolph P., Krüger J., Baudach S., Kautek W. Appl. Surf. Sci. 154-155:2000;659.
8. J. Bonse, Ph.D. Thesis, TU Berlin, 2001.
9. JANAF Tables, J. Phys. Chem. Ref. Data 14, Suppl. 1 (1985) (1988 update).
10. Woydt M., Skopp A., Dörfel I., Witke K. Wear. 218:1998;84.
11. Göhlert K., Irmer G., Michalowsky L., Monecke J. Mat.-Wiss. u. Werkstofftech. 21:1990;108.
12. Palma C., Rossi M.C., Sapia C., Bemporad E. Appl. Surf. Sci. 138-139:1999;24.
13. Veprek S., Sarott F.-A., Iqbal Z. Phys. Rev. B. 36:1987;3344.
14. Acker W.P., Yip B., Leach D.H., Chang R.K. J. Appl. Phys. 64:1988;2263.
15. Parker J.C., Siegel R.W. J. Mater. Res. 5:1990;1246.
16. Begun G.M., Bamberger C.E. Appl. Spectr. 43:1989;134.
17. Mitu B., Dinescu G., Dinescu M., Ferrari A., Balucani M., Lamedica G., Dementjev A.P., Maslakov K.I. Thin Solid Films. 383:2001;230.
18. J. Chastain, Handbook of X-Ray Photoelectron Spectroscopy, Perkin-Elmer Corporation, Physical Electronics Division, Eden Prairie, MN, 1992.
19. Baunack S., Oswald S., Tönshoff H.K., von Alvensleben F., Temme T. Fresenius J. Anal. Chem. 365:1999;173.