Surface characterisation of laser irradiated SiC ceramics by AES and XPS

Fresenius' Journal of Analytical Chemistry

Volumn 365, Issue 1-3, 1999, Pages 173-177

  Baunack, S ^a   Oswald, S ^a   Tonshoff H K ^b   Von Alvensleben, F ^b   Temme, T ^b  

^a IFW DRESDEN   (Germany)

^b LASER ZENTRUM HANNOVER E V   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002578637     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160051467     Document Type: Article

References (15)

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