Hopping motion of chlorine atoms on Si(1 0 0)-(2 × 1) surfaces induced by carrier injection from scanning tunneling microscope tips

Surface Science

Volumn 531, Issue 1, 2003, Pages 68-76

  Nakamura, Yoshiaki ^a   Mera, Yutaka ^a   Maeda, Koji ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

Chlorine; Desorption induced by electron stimulation; Scanning tunneling microscopy; Scanning tunneling spectroscopies; Semiconducting surfaces; Silicon; Surface electronic phenomena (work function, surface potential, surface states, etc.)

Indexed keywords

ANISOTROPY; CHEMICAL BONDS; CRYSTAL ORIENTATION; ELECTRON TUNNELING; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON;

SEMICONDUCTING SURFACES;

CHLORINE;

EID: 0037431534     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(03)00398-4     Document Type: Article

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