Nanoscale Imaging of Electronic Surface Transport Probed by Atom Movements Induced by Scanning Tunneling Microscope Current

Physical Review Letters

Volumn 89, Issue 26, 2002, Pages

  Nakamura, Yoshiaki ^a   Mera, Yutaka ^a   Maeda, Koji ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; CHLORINE; ELECTRON RESONANCE; ELECTRON TRANSPORT PROPERTIES; ELECTRONIC DENSITY OF STATES; FERMI LEVEL; IMAGING TECHNIQUES; NUMERICAL ANALYSIS; QUANTUM THEORY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; SURFACE STRUCTURE;

ATOM HOPPING RATE; ELECTRON INJECTION; ELECTRONIC SURFACE TRANSPORT; NANOSCALE IMAGING; SILICON-CHLORINE ANTIBONDING STATE;

ATOMIC PHYSICS;

EID: 0037165001     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.89.266805     Document Type: Article

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