XPS and He II photoelectron yield study of the activation process in Ti-Zr NEG films

Vacuum

Volumn 71, Issue 1-2 SPEC., 2003, Pages 329-333

  Zemek, J ^a   Jiricek, P ^a  

^a INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

Activation process; Non evaporable getters; Oxide reduction; Photoelectron yield; Ti Zr alloys; XPS

Indexed keywords

CHEMICAL BONDS; GETTERS; HELIUM; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

OXIDE REDUCTION;

TITANIUM ALLOYS;

EID: 0037427462     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0042-207X(02)00760-1     Document Type: Conference Paper

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