Monte Carlo simulation of electromigration phenomena in metallic lines

Mathematics and Computers in Simulation

Volumn 62, Issue 3-6, 2003, Pages 495-499

  Pennetta, C ^a   Reggiani, L ^a   Alfinito, E ^a  

^a NATIONAL NANOTECHNOLOGY LABORATORY   (Italy)

Author keywords

Electromigration; Percolation; Resistors

Indexed keywords

COMPUTER SIMULATION; FAILURE ANALYSIS; MONTE CARLO METHODS; PERCOLATION (SOLID STATE); RANDOM PROCESSES; RESISTORS; STRESS ANALYSIS;

METALLIC LINES;

ELECTROMIGRATION;

EID: 0037417002     PISSN: 03784754     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0378-4754(02)00221-5     Document Type: Conference Paper

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